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Awards
- Fellow
- Institute of Electrical and Electronics Engineers (IEEE) (2012.1.1)
- for contributions to testing of integrated circuits
IEEE Fellow Class 2012
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- Best Paper Award
- The 7th International Test Conference in Asia (2023.9.12)
- "A Low Overhead and Double-Node-Upset Self-Recoverable Latch"
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- Best Paper Award
- 2022 Asian Hardware Oriented Security and Trust Symposium (2022.12.20)
- "MRCO: A Multi-Ring Convergence Oscillator-Based High-Efficiency True Random Number Generator"
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- Best Paper Award
- 30th IEEE Asian Test Symposium (2021.11.24)
- "GPU-Accelerated Timing Simulation of Systolic-Array-Based AI Accelerators"
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- Best Paper Award
- Institute of Electronics, Information and Communication Engineers (IEICE)
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- Information and Systems Society (2009.11.26)
- for papers on low-capture-power test generation for VLSIs
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- Best Paper Award
- 25th IEEE Asian Test Symposium (2016.11.22)
- "Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch"
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- Best Paper Award
- 7th IEEE Workshop on RTL and High Level Testing (2007.10.12)
- "An Improved Method of Per-Test X-fault Diagnosis for Deep-Submicron LSI
Cricuits"
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- Research Recognition Award
- Information Processing Society of Japan / Northeastern Section (1994.5.11)
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