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• 2024.6.24: A Chinese textbook on IC testing "数字集成電路測試" was published by Tshinghua University Press. Prof. Wen authored two chapters: Chapter 3 (Test Generation) and Chapter 5 (Logic Built-In Self-Test).

• 2024.5.24: Prof. Wen attended the 5th Hibikino Test Workshop LSI.

• 2024.5.12: Prof. Wen gave a keynote speech titled "Power-Aware LSI Testing: Present and Future" at the 2nd International Symposium on EDA, Xi`an, China.

• 2024.5.7: Prof. Wen gave an invited talk titled "LSI Testing: A Core Technology for a Sucessful Semiconductor Industry" at the Workshop on Integrated Circuits and Smart Photoelectronics, Yinchuan, China.

• 2024.4.18: Prof. Wen gave a talk titled "LSI Testing: A Core Technology for the LSI Industry" for studnets at the Department of Electrical and Computer Engineering, IIIT Bhopal, India.

• 2024.3.28: Prof. Wen attended a KyuTech-Kyudai Joint Research Meeting.

• 2024.3.23: Prof. Wen gave a keynote speech titled "LSI Testing: A Core Technology to the LSI Industry" at the 7th International Conference on Electronics, Communications and Engineering in Kuala Lumpur, Malayisia.

• 2024.3.20: Prof. Wen attended SEMICON China in Shanghai, China.

• 2024.3.17: Prof. Wen gave an invited talk titled "Assessing the Power-Awareness of VLSI Testing" at the Conference of Science & Technology for Integrated Circuits (CSTIC) 2024 in Shanghai, China.

• 2024.3.6: Prof. Wen attended (1)(2) the 15th LSI Test Workshop in Fukuoka, Japan.

• 2024.2.28: Prof. Wen gave a keynote speech titled "LSI Testing: A Core Technology to the LSI Industry" at the 13th International Conference on Information and Electronics Engineering in Jeju, Korea.

• 2024.1.25: Prof. Wen attended the 88th FTC Workshop.

• 2024.1.24: Prof. Wen attended a meeting with Dr. K. Abdel-Hafez at Synopsys.

• 2024.1.1: Wish you and your family a happy, healthy, and prosperous 2024!

• Past News