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about my research and education activities.
In research, I am striving to develop innovative solutions to test generation,
design for test, fault diagnosis, and reliability enhancement for VLSI
circuits. My research goal is to make test a value-adding means, rather
than a cost factor, for the semiconductor industry. In education, I am
striving to arm my students with not only abundant technical knowledge but also strong problem-solving capability, creativity,
team spirit, as well as presentation and communication skills. My education
goal is to help my students to thrive, not just survive, in highly competitive
and global professional environments.
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Department of Computer Science and Networks
Faculty of Computer Science and Systems Engineering
Kyushu Institute of Technology
Kawazu 680-4, Iizuka, Fukuoka 820-8502, Japan
* (1) Frequently Requested Papers VTS05/VTS11/ETS12/ITC12/ATS15/ETS18/ASICON21 (2) 夢ナビ記事 (3) 研究室紹介 (4) Wen-Lab-Designed Chip for Test Power Evaluation (with Patented Delay Measurement Circuitry)