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Journal Review
- TC: IEEE Transactions on Computers
- D&T: IEEE Design and Test of Computers
- TCAD: IEEE Transactions Computer-Aided Design of Integrated Circuits and Systems
- TVLSI: IEEE Transactions on VLSI Systems
- TCAS: IEEE Transactions on Circuits and Systems
- TODAES: ACM Transactinos on Design Automation of Eletronic Systems
- IET: IET Computers & Digital Techniques
- VLSI-Int: VLSI Journal of Integration
- JETTA: Journal of Electronic Testing: Theory and Applications
- JLOPE: ASP Journal of Low Power Electronics
- IEICE: IEICE Transactinos on Information and Systems
- IPSJ: IPSJ Transactions on System LSI Design Methodology
- JCST: Journal of Computer Science and Technology
- JCSC: Journal of Circuits, Systems, and Computers
- JETC: Journal on Emerging Technologies in Computing Systems
- CETR: Journal of Current Engineering and Technological Research
- MEJ: Microelectronics Journal
- SWJ: Scientific World Journal
- REAJ: Journal of Reliability Engineering Association of Japan

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