News

Profile

Members


Research

Grants

Papers

Patents

Books

Talks

Services

Awards

Courses

Contact



Program Committees
  • DAC: IEEE/ACM Design Automation Conference (2010-2011, 2021-2023)
  • ITC: IEEE International Test Conference (2007-2014, 2016-2022)
  • ETS: IEEE European Test Symposium (2008-2023)
  • ATS: IEEE Asian Test Symposium (1997-2022)
  • ITC-Asia: IEEE International Test Conference in Asia (2017-2021)
  • DATE: Design, Automation and Test in Europe Conference (2009-2017, 2019-2023)
  • DTIS: IEEE International Conference on Design & Test of Integrated Systems in Nanoscale Technology (2006-2021)
  • DFT: IEEE International Symposium on Defect and Fault Tolerance in VLSI and nanotechnology Systems (2008-2016)
  • PRDC: IEEE Pacific Rim International Symposium on Dependable Computing (2009-2012)
  • ICCD: IEEE International Conference on Computer Design (2008, 2014-2018)
  • DELTA: IEEE International Symposium on Electronic Design, Test, & Applications (2004, 2006, 2008, 2010-2011)
  • ASP-DAC: IEEE/ACM Asian and South Pacific Design Automation Conference (1997-2000, 2004-2005)
  • ASICON: IEEE International Conference on ASIC (2009, 2011, 2013, 2015, 2017, 2019)
  • VLSI-SoC: IFIP/IEEE International Conference on Very Large Scale Integration (2010-2013, 2021-2022)
  • ICNSC: IEEE International Conference of Networking, Sensing and Control (2010, 2012)
  • VDAT: VLSI Design and Test Symposium (2009-2011)
  • WRTLT: IEEE Workshop on RTL and High Level Testing (2000-2005, 2009-2011, 2013-2018, 2020, 2022)
  • DATA: IEEE International Workshop on Defect and Adaptive Test Analysis (2007-2016)
  • LPonTR: IEEE International Workshop on Impact of Low-Power design on Test and Reliability (2009-2012)
  • ISVLSI: IEEE Computer Society Annual Symposium on VLSI (2012-2019)
  • IRIC: IEEE International Reliability Innovations Conference (2013)
  • LATS: IEEE Latin-American Test Symposium (2013-2016, 2021-2023)
  • GLVLSI: Great Lakes Symposium on VLSI (2013-2016)
  • ATC: International Conference on Advanced Technologies for Communications (2013)
  • VLSID: International Conference on VLSI Design (2014-2019)
  • APCCAS: IEEE Asia Pacific Conference on Circuits and Systems (2012, 2014, 2020-2021)
  • TJCAS: Taiwan and Japan Conference on Circuits and Systems (2019)
  • VLSI-DAT: International Symposium on VLSI Design, Automation, and Test (2015-2022)
  • iSES: IEEE International Symposium on Smart Electronic Systems (2015-2016, 2019-2022)
  • ACSS: International Doctoral Symposium on Applied Computation and Security Systems (2016-2017)
  • MCSoC: IEEE International Symposium on Embedded Multicore/Many-Core Systems-on-Chip (2020-2022)
  • ICEDA: International Conference on Electron Device and Applications (2021)
  • International Workshop on Computer-Aided Design, Test, and Evaluation for Dependability (1997)