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Authored Book Chapters
- Harry H. Chen, X. Wen, and W.-T. Cheng, Chapter 1: Prerequests on Fault
Diagnosis, pp. 1-24, Springer Cham, Mar. 2023.
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- X. Wen and I. Shimizu, Chapter 3: Product Classification, Introduction to Semiconductor Circuits, pp. 86-115, pp. 156-178, NIKKEI BP, Tokyo, Dec. 2020aaaaiiiiiiiiiiiiiiiiiiiiiiiiiiiiiiiiiii iiiiiiiiiiiiiciiiiiiiiiiiiiiiiiiiiiiiiiiiiiiiiiiii
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- L.-T. Wang, X. Wen, and S. Wu, Chapter 7: Test Synthesis, Electronic Design Automation: Synthesis, Verification, and Test, pp. 405-448, Morgan Kaufmann, San Francisco, Oct. 2008.
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