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• Huawei Li, Wu-Tung Cheng, Xiaoqing Wen, Liyang Lai, Jing Ye, and Xiaowei Li, Digital Integrated Circuit Testing, Tshinghua University Press, Jun. 2024.

• Trailokya Sasamal, Hari Mohan Gaur, Ashutosh Kumar Singh, and Xiaoqing Wen, Quantum-Dot Cellular Automata Circuits for Nanocomputing Applications, CRC Press, Boca Raton, Jul. 2023.

• Patrick Girard, Nicola Nicolici, and Xiaoqing Wen, Power-Aware Testing and Test Strategies for Low Power Devices, Springer, New York, Nov. 2009.

• Laung-Turng Wang, Cheng-Wen Wu, and Xiaoqing Wen, VLSI Test Principles and Architectures: Design for Testability, Morgan Kaufmann, San Francisco, July 2006.