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• 2024.12.19: Prof. Wen gave a keynote speech titled "Risks of LSIs and What Can We Do about them" at the 7th International Conference on Recent Trends in Image Processing & Pattern Recognition, Bhopal, India.

• 2024.11.22: Prof. Wen received an award and a commemorative clock for his 20 years' service at Kyushu Institute of Technology.

• 2024.11.20: A joint research program on "Fine-Clocking-Based IC Testing for Advanced Manufacturing Processes" between Kyushu Institute of Technology (PI: Prof. Xiaoqing Wen) and National Taiwan University of Science and Technology (PI: Prof. Poki Chen) was formally funded.

• 2024.11.7: Ms. Chencan Zhou, a lecturer from Nantong University, gave a presentation on her research in her last lab meeting before going back to China after a one year as a visiting researcher.

• 2024.10.29: Prof. Wen visited Southeast University and gave a talk titiled "Integrated Circuit Industry and Integrated Circuit Testing Technology" in Nanjing, China.

• 2024.10.26: Prof. Wen gave a keynote speech titled "Power-Aware LSI Testing: Present and Future" at the 9th International Conference on Integrated Circuits and Microsystems, Wuhan, China.

• 2024.10.24: Prof. Wen attended SWTEST Asia 2024 in Fukuka, Japan.

• 2024.10.22: Prof. Wen gave a ketnote speech, titled "LSI Testing: A Core Technology for a Successful Semiconductor Industry" at the 4th International Conference on Electron Devices and Applications, Singapore.

• 2024.10.15: Prof. Wen gave a lecture, titled "LSI Testing: A Core Technology for a Successful Semiconductor Industry", to National Taiwan University of Science and Technolgy.

• 2024.10.12: Prof. Wen gave an introductory lecture on semiconductor ICs in Kitakyushu, Japan.

• 2024.9.25: Mr. Shiling Shi from the Wen Lab got his Ph.D degree. Mr. Xi Wang and Mr. Yue Shi from the Wen Lab got their Master degrees.

• 2024.9.19: Prof. Wen visited Nanjing Post and Communications University (Pukou Campus) and gave a talk titiled "Overview of VLSI Testing" in Nanjing, China.

• 2024.9.18: Prof. Wen visited Southeast University (Wuxi Campus) and gave a talk titiled "Overview of VLSI Testing" in Wuxi, China.

• 2024.8.26: Prof. Wen visited Tsinghua University and gave a talk titiled "Machine-Learning-Based Optimization of VLSI Burn-In Testing" in Beijing, China.

• 2024.8.23: Prof. Wen visited Hefei University of Technology and gave a talk titiled "VLSI Testing: An Overview" in Hefei, China.

• 2024.8.21: Prof. Wen attended the 2024 Southeast Forum on AI and EDA in Nanjing, China.

• 2024.8.19: Prof. Wen received the Best Paper Award for a co-authored paper titiled "A Low Overhead and Double-Node-Upset Self-Recoverable Latch", presented at the 7th International Test Conference in Asia, held in Matsue, Japan.

• 2024.8.19: Prof. Wen attended the 8th International Test Conference in Asia in Changsha, China.

• 2024.6.24: A Chinese textbook on IC testing "数字集成電路測試" was published by Tshinghua University Press. Prof. Wen authored two chapters: Chapter 3 (Test Generation) and Chapter 5 (Logic Built-In Self-Test).

• 2024.5.24: Prof. Wen attended the 5th Hibikino Test Workshop LSI.

• 2024.5.12: Prof. Wen gave a keynote speech titled "Power-Aware LSI Testing: Present and Future" at the 2nd International Symposium on EDA, Xi`an, China.

• 2024.5.7: Prof. Wen gave an invited talk titled "LSI Testing: A Core Technology for a Sucessful Semiconductor Industry" at the Workshop on Integrated Circuits and Smart Photoelectronics, Yinchuan, China.

• 2024.4.18: Prof. Wen gave a talk titled "LSI Testing: A Core Technology for the LSI Industry" for studnets at the Department of Electrical and Computer Engineering, IIIT Bhopal, India.

• 2024.3.28: Prof. Wen attended a KyuTech-Kyudai Joint Research Meeting.

• 2024.3.23: Prof. Wen gave a keynote speech titled "LSI Testing: A Core Technology to the LSI Industry" at the 7th International Conference on Electronics, Communications and Engineering in Kuala Lumpur, Malayisia.

• 2024.3.20: Prof. Wen attended SEMICON China in Shanghai, China.

• 2024.3.17: Prof. Wen gave an invited talk titled "Assessing the Power-Awareness of VLSI Testing" at the Conference of Science & Technology for Integrated Circuits (CSTIC) 2024 in Shanghai, China.

• 2024.3.6: Prof. Wen attended (1)(2) the 15th LSI Test Workshop in Fukuoka, Japan.

• 2024.2.28: Prof. Wen gave a keynote speech titled "LSI Testing: A Core Technology to the LSI Industry" at the 13th International Conference on Information and Electronics Engineering in Jeju, Korea.

• 2024.1.25: Prof. Wen attended the 88th FTC Workshop.

• 2024.1.24: Prof. Wen attended a meeting with Dr. K. Abdel-Hafez at Synopsys.

• 2024.1.1: Wish you and your family a happy, healthy, and prosperous 2024!

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