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IDDQ Test

  1. X. Wen, S. Kajihara, H. Tamamoto, K. K. Saluja, and K. Kinoshita, "On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies," IEICE Trans. on Inf. & Syst., Vol. E88-D, No. 4, pp. 703-710, Apr. 2005.
  2. H. Yokoyama, X. Wen, and H. Tamamoto, "Random Pattern Testable Design with Partial Circuit Duplication and IDDD Testing," Systems and Computers in Japan, Vol. 30, No. 5, pp. 18-27, May 1999.
  3. H. Yokoyama, X. Wen, and H. Tamamoto, "Improving Random Pattern Testability with Partial Circuit Duplication Approach," IEICE Trans. on Inf. & Syst., Vol. E81-D, No. 7, pp. 654-659, Jul. 1998.
  4. 横山洋之，温暁青，玉本英夫, "部分２重化とIDDQテストによる論理回路のランダムテスト容易化手法," 電子情報通信学会論文誌D-I, Vol. J81-D-I, No. 6, pp. 851-860, 1998年6月.
  5. H. Yokoyama, X. Wen, and H. Tamamoto, "Random Testing with Partial Circuit Duplication and Monitoring IDDQ," Proc. of IEEE Int’l Workshop on IDDQ Testing, pp. 7-11, Washington D.C., USA, Oct. 1997.
  6. Y. Kim, K. K. Saluja, X. Wen, and B. Vinnakota, "On IDDT Testing of CMOS Circuits for Stuck-Open Faults," Proc. of Int'l. Conf. on Modeling, Simulation and Optimization, pp. 347-352, Singapore, Aug. 1997.
  7. X. Wen, H. Tamamoto, and K. Kinoshita, "IDDQ Test Vector Selection for Transistor Short Fault Testing," Systems and Computers in Japan, Vol. 28, No. 5, pp. 11-21, May 1997.
  8. 温暁青，玉本英夫，樹下行三, "トランジスタ短絡故障のIDDQテストベクトルの選択について," 電子情報通信学会論文誌 D-I, Vol. J79-D-I, No. 12, pp. 1113-1122, 1996年12月.
  9. X. Wen, K. K. Saluja, K. Kinoshita, and H. Tamamoto, "Equivalence Fault Collapsing for Transistor Leakage Faults," Proc. of IEEE Int’l Workshop on IDDQ Testing, pp. 79-83, Washington DC, USA, Oct. 1996.
  10. X. Wen, H. Tamamoto, and K. Kinoshita, "Transistor Leakage Fault Location with IDDQ Measurement," Proc. of IEEE Asian Test Symp., pp. 51-57, Bangalore, India, Nov. 1995.
  11. X. Wen, H. Tamamoto, and K. Kinoshita, "Equivalence Fault Collapsing for Transistor Short Faults and Its Application to IDDQ Subset Selection," Proc. of IEEE Int’l Workshop on IDDQ Testing, pp. 30-34, Washington DC, USA, Oct. 1995.