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LSI Test
- T. Ni, W. Jiang, H. Liang, X. Wen, and M. Nie, "Segmentation-Enhanced
Overlapped Defect Identification for Multi-Patterns Wafer Maps," IEEE Trans. on Instrumentation & Measurement. (Accepted ).
- Z. Guo, A. Yan, Z. Huang, J. Cui, B. Roh, G. Liu, P. Girard, and X. Wen,
"Graph-Based Multi-Task Transfer Learning for Fault Ditection and
Diagnosis of Few-Shot Analog Circuits," The IEEE Internet of Things Journal. (Accepted
).
- T. Ni, W. Rui, M. Niu, Y. Li, C. Zhou, and X. Wen, "A Novel Approach
to Reducing Testing Costs and Minimizing Defect Escapes Using Neighborhood
Range and Shapley Val;ues," ACM Trans. on Design Automation of Electronic Systems. (Accepted).
- W. Zhan, Y. Zhou J. Zheng, X. Cai, Q. Zhang, and X. Wen, "A Method
for Grading Failure Rates within the Dynamic Effective Space of Integarted
Circuits after Testing," Applied Sciences, 2025, 15, 2009.
- X. Wen, "LSI Testing: A Core Technology to A Successful LSI Industry,"
Proc. of IEEE Int'l Conf. on ASIC, Paper P0065, Kunming, China, Oct. 2021.
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