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Simulation
- E. Schneider, M. A. Kochte, S. Holst, X. Wen, and H.-J. Wunderlich, "GPU-Accelerated
Simulation of Small Delay Faults," IEEE Trans. on Computer-Aided Design, Vol. 36, No. 5, pp. 829-841, May 2017.
- E. Schneider, S. Holst, M.-A. Kochte, X. Wen, and H.-J. Wunderlich, "GPU-Accelerated Small Delay Fault Simulation," Proc. of Design and Test in Europe, pp. 1174-1179, Grenoble, France, Mar. 2015.
- S. Holst, J. Miyazaki, and X. Wen, "Towards Memory-Aware VLSI Simulation
Algorithms for Heterogeneous Architectures," Proc. of Int'l Symp. on Applied Engineering and Sciences, Kita-Kyushu, Japan, Dec. 2014.
- E. Schneider, S. Holst, X. Wen, and H.-J. Wunderlich, "Data-Parallel
Switch-Level Simulation for Fast and Accurate Timing Validation of CMOS
Circuits," Proc. of IEEE/ACM Intl. Conf. on Computer-Aided Design, pp. 17-23, San Jose, USA, Nov. 2014.
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E. Schneider, S. Holst, X. Wen, and H.-J. Wunderlich, "Data-Parallel Switch-Level Simulation for Fast and Accurate Timing Validation of CMOS Circuits," Poster at ACM Design Automation Conf., San Francisco, USA, Jun. 2014.
- M. A. Kochte, S. Kundu, K. Miyase, X. Wen, and H.-J. Wunderlich, "Efficient BDD-based Fault Simulation in Presence of Unknown Values," Proc. of IEEE Asian Test Symp., pp. 383-388, New Delhi, India, Nov. 2011.
- S. Oku, S. Kajihara, K. Miyase, X. Wen, and Y. Sato, "On Calculation
of Delay Range in Fault Simulation for Test Cubes," Proc. of Int'l Symp. on VLSI Design, Automation, and Test, pp. 64-67, Hsinchu, Taiwan, Apr. 2009.
- S. Oku, S. Kajihara, K. Miyase, X. Wen, and Y. Sato, "On Delay Calculation
in 3-Valued Fault Simulation," Proc. of IEEE Workshop on RTL and High Level Testing, pp. 123-128, Sapporo, Japan, Nov. 2008.
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K. Taniguchi, H. Fujii, S. Kajihara, and X. Wen, "Hybrid Fault Simulation
with Compiled and Event-Driven Methods," Proc. of IEEE Int'l Conf. on Design & Test of Integrated Systems in Nanoscale Technology, pp. 240-243, Tunis, Tunisia, Sep. 2006.
- ·ΕΒC΄½iCΚ{pvCK. K. SalujaCχΊsO, "ΤΜαd³lπ΅€ΜαV~
[VΜ¬»ΙΒ’Δ,"
dqξρΚMwο_Ά, D-I, Vol. J88-D-I, No. 4, pp. 906-907, 2005N4.

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