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Test Compression
- L.-T. Wang, X. Wen, S. Wu, Z. Wang, Z. Jiang, B. Sheu, and X. Gu, "VirtualScan:
Test Compression Technology Using Combinational Logic and One-Pass ATPG,"
IEEE Design & Test of Computers, Vol. 25, No. 2, pp. 122-130, Mar.-Apr. 2008.
- Y. Hu, C. Li, J. Li, Y. Han, X. Li, W. Wang, H. Li, L.-T. Wang, and X. Wen, "Test Data Compression Based on Clustered Random Access Scan," Proc. of IEEE Asian Test Symp., pp. 231-236, Fukuoka, Japan, Nov. 2006.
- L.-T. Wang, K. S. Abdel-Hafez, X. Wen, B. Sheu, S. Wu, S. Lin, and M. Chang,
"UltraScan: Using Time-Division Demultiplexing/Multiplexing (TDDM/TDM)
with VirtualScan for Test Cost Reduction," Proc. of IEEE Int'l Test Conf., pp. 946-953, Austin, USA, Nov. 2005.
- Y. Doi, S. Kajihara, X. Wen, L. Li, and K. Chakrabarty, "Test Compression for Scan Circuits Using Scan Polarity Adjustment and Pinpoint Test Relaxation," Prof. of IEEE/ACM Asian and South Pacific Design Automation Conf., pp. 59-64, Shanghai, China, Jan. 2005.
- L.-T. Wang, X. Wen, H. Furukawa, F. Hsu, S. Lin, S. Tsai, K. S. Abdel-Hafez,
and S. Wu, "VirtualScan: A New Compressed Scan Technology for Test
Cost Reduction," Proc. of IEEE Int'l Test Conf., pp. 916-925, Charlotte, USA, Oct. 2004.
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