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EU Patents
01 EP01370880B1 A MULTIPLE-CAPTURE DFT SYSTEM FOR SCAN-BASED INTEGRATED
CIRCUITS
02 EP01360513B1 MULTIPLE-CAPTURE DFT SYSTEM FOR DETECTING OR
LOCATING CROSSING CLOCK-DOMAIN FAULTS DURING SELF-TEST OR SCAN TEST
03 EP01377981B1 METHOD AND SYSTEM TO OPTIMIZE TEST COST AND DISABLE DEFECTS FOR SCAN AND BIST MEMORIES
04 EP01364436B1 METHOD AND APPARATUS FOR DIAGNOSING FAILURES
IN AN INTEGRATED CIRCUIT USING DESIGN-FOR-DEBUG (DFD) TECHNIQUES
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