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Invited Talks
- "Integrated Circuit Industry and Integrated Circuit Testing Technology",
School of Microelectronics, Southeat University, Nanjing, China, Oct. 29, 2024.
- "LSI Testing: A Core Technology for a Successful Semiconductor Industry",
集積回路与智能光電検討会, Yinchuan, China, May 7, 2024.
- "Assessing the Power-Awareness of VLSI Testing", Conference of Science and Technology for Integrated Circuits, Mar. 17, 2024. Virtual Event
- "半導体の光と影と癖 〜半導体グルーバル大競争への複層的視点〜",プロジェクトマネジメント学会九州支部20周年記念シンポジウム, Nov. 9, 2023.
- Power-Aware Testing for Low-Power LSI Circuits", China Semiconductor Technology International Comference, Symposium VI, Jun. 26, 2023. Virtual Event
- "The Light, Shadow, and Habit of Semiconductor Circuits", Special Seminar of the Association of Chinese Professors in Japan, Nov. 27, 2022. Virtual Event
- "Power-Aware IC Testing: Present and Future", The 1st CCF Chip Conference, Nanjing, China, Jul. 30, 2022. Hybrid Event
- "LSI Testing: A Core Technology to A Successful LSI Industry",
The IEEE International Conference on ASIC, Kumming, China, Oct. 29, 2021. Virtual Event
- "Power-Aware Testing for Low-Power LSI Circuits", The 9th IEEE International Symposium on Next-Generation Electronics, Changsha, China, Jul. 10, 2021. Virtual Event
- "LSI Test: from Research to Business", The 18th China Fault Tolerant Computing Conference, Beijing, China, Aug. 15, 2019.
- "Power-Aware Testing of Low-Power VLSI Circuits", The 15th IEEE International Conference on Electron Devices and Solid-State
Circuits, Xi'an, China, Jun. 13, 2019.
- "Power-Aware Testing for Low-Power LSI Circuits", Beijing University of Technology, Beijing, China, Dec. 28, 2018.
- "All about ICs: From Technology Trends to Career Choices", School of Software, Tsinghua University, Beijing, China, Dec. 26, 2018.
- "Power-Aware LSI Testing: Challenges and Strategies", Beijing University of Aeronautics and Astronautics, Beijing, China, Mar. 29, 2018.
- "Power-Aware Testing for Low-Power VLSI Circuits", School of Software, Tsinghua University, Beijing, China, Dec. 29, 2017.
- "All abour ICs: From Technology Trends to Career Choices", School of Computer Science and Technology, Anhui University, Xuancheng, China, Mar. 10, 2017.
- "All abour ICs: From Technology Trends to Career Choices", Xuancheng Campus, Hefei University of Technology, Xuancheng, China, Mar. 8, 2017.
- "All abour ICs: From Technology Trends to Career Choices", School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China, Mar. 7, 2017.
- "Power-Aware Testing For Low-Power VLSI Circuits", The 13th IEEE International Conference on Solid-State and Integrated Circuit
Technology, Hangzhou, China, Oct. 26, 2016.
- "IC: Technical Trends and Career Development", Nantong University, Nantong, China, Oct. 24, 2016.
- "Power Supply Noise and Its Reduction in At-Speed Scan Testing",
The IEEE 11th International Conference on ASIC, Chengdu, China, Nov. 5, 2015.
- "From Low-Power Test to Power-Safe Test", Duke University, Durham, USA, Oct. 17, 2014.
- "From Low-Power Test to Power-Safe Test", Tsinghua University, Beijing, China, Oct. 10, 2014.
- "From Low-Power Test to Power-Safe Test", Hefei University of Technology, Hefei, China, Sep. 23, 2014.
- "Power-Aware Testing: The Next Stage", University of Stuttgart, Stuttgart, Germany, May 21, 2014.
- "Low-Power LSI Testing", The 13th International Workshop on Microelectronics Assembling and
Packaging, Fukuoka, Japan, Nov. 7, 2013.
- "Power-Aware Testing: The Next Stage", National Sun Yat-Sen University, Kaohsiung, Taiwan, Sep. 26, 2013.
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"Power-Aware Testing: The Next Stage", National Chun Hsing University, Taichung, Taiwan, Sep. 17, 2013.
- "Power-Aware Testing: The Next Stage", Hefei University of Technology, Hefei, China, Jun. 26, 2013.
- "Towards the Next-Generation Power-Aware Testing Technologies",
CMOS Emerging Technologies Conference, Vancouver, Canada, Jul. 19, 2012.
- "半導体集積回路の同歩留り化プラットフォームの研究開発", 福岡県先端半導体意見交換会, Apr. 9, 2012.
- "Power-Aware Testing for Low-Power VLSI Circuits", State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Science, Beijing, China, Mar. 29, 2012.
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"Power-Aware Testing for Low-Power VLSI Circuits", School of Software, Tsinghua University, Beijing, China, Mar. 29, 2012.
- "Power-Aware Testing for Low-Power VLSI Circuits", ECE Seminar, University of Connecticut, Storrs, USA, Dec. 16, 2011.
- "Low-Power Testing for Low-Power Devices", Hong Kong Chinese University, Hong Kong, China, Oct. 6, 2011.
- "Low-Power Testing for Low-Power Devices", AMD Tech Forum, Shanghai, China, Jan. 24, 2011.
- "Power-Aware Test for Low-Power Devices", International Workshop on Microelectronics Assembling and Packaging, Fukuoka, Japan, Nov. 18, 2010.
- "Low-Aware Test for Low-Power Devices", IEEE International Symposium on Defect and Fault Tolerance in VLSI and
Nanotechnology Systems, Kyoto, Japan, Oct. 7, 2010.
- "Power-Aware Test for Low-Power LSI Circuits", CMOS Emerging Technologies Conference, Whistler, Canada, May 19, 2010.
- "Challenges and Chances in Deep-Submicron LSI Testing", Academic Forum on Computer Science and Technology, Shanghai University, Shanghai, China, Mar. 20, 2010.
- "省電力志向テスト技術(Power-Aware Testing) の現状と課題", 第4回四国シリコンテスト技術研究会, 平成22年2月5日.
- "From Artillery Fire to Sniper Fire: A Paradigm Shift in Test Power Reduction", Elevator Talk Session, IEEE International Test Conference, Austin, USA, Nov. 5, 2009.
- "Low-Power Test Generation for Reducing Yield Loss Risk in At-Speed
Scan Testing", Special Seminar at University of Wisconsin - Madison, Madison, USA, Oct. 30, 2009.
- "VLSIの低消費電力テスト技術", 半導体テスト技術交流会, 平成21年2月13日.
- "低消費電力テスト: 現状と展望", アドバンテスト展テクニカルセミナー, 平成20年6月4日.
- "Challenges and Chances in Deep-Submicron LSI Testing", Electrical and Computer Engineering, University of Connecticut, Storres, USA, Apr. 25, 2008.
- "Test Strategies for Low Power Devices (Power Issues during Test)",
Hot-Topic Session, Design, Automation, and Test in Europe, Germany, Mar. 12, 2008. (Report)
- "SIAT:Signal-Integrity-Aware Testing", SEMI テクノロジーシンポジウム, 平成19年12月6日.
- "LSIテスト技術の開発動向について", 平成19年度知的財産セミナー, 平成19年11月15日.
- "テスト技術の概論と最新動向", 平成19年度大分県LSIクラスター推進会議総会, 平成19年7月23日.
- "SIAT:Signal-Integrity-Aware Testingを目指して", JEITA: STRJ-WG2, 平成18年10月5日.
- "集積回路の高信頼化技術", 九州工業大学技術交流会(三木会), 平成18年5月18日.
- "集積回路のテスト技術の研究開発", 第19回e-ZUKAトライバレー産学官交流研究会, 平成18年4月12日.
- "Low-Capture-Power Test Generation for Scan-Based At-Speed Testing",
Computer Engineering Seminar, University of Wisconsin - Madison, Madison, USA, Oct. 30, 2005.
- "ディジタルLSIのテスト技術の最新動向", ウエハテストビジネス研究会, 平成17年6月28日.
- "LSIテスト: 現状と動向", 福岡県産業・科学技術振興財団VLSIテスト技術研究会, 平成17年3月23日.
- "A Method for Low-Capture-Power At-Speed Test Generation", School of Software Engineering, Tsinghua University, Beijing, China, Jan. 21, 2005.
- "LSIテストとテスト容易化設計 〜現状と動向〜", 平成16年度第4回大分県半導体関連企業ビジネスチャンス研究会, 平成16年12月15日.
- "On Low-Capture-Power Test Generation for Scan Testing", School of Software Engineering, Tsinghua University, Beijing, China, Oct. 6, 2004.
- "On Low-Capture-Power Test Generation for Scan Testing", Institute of Computing Technology, Beijing, China, Oct. 4, 2004.
- "At-Speed Logic BIST for Multi-Clock Multi-frequency Designs",
Center for Reliable Computing, Stanford University, Beijing, China, Jun. 19, 2002.

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