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Keynote Speeches
  1. "Power-Aware LSI Testing: Presrnt and Future", The 8th International Conference on Electronics, Communications and Control Engineering, Fukuoka, Japan, Mar. 29, 2025.
  2. "Power-Aware LSI Testing: Presrnt and Future", The Forum on Life-Ccyle-Reliability of Chiplet-Based Systems, Oita, Japan, Mar. 14, 2025.
  3. "Risks of LSIs and How Can We Do about Them", The 7th International Conference on Recent Trends in Image Processing & Pattern Recognition Integrated Circuits and Microsystems, Bhopal, India, Dec. 19, 2024.
  4. "Power-Aware LSI Testing: Present and Future", The 9th International Conference on Integrated Circuits and Microsystems, Wuhan, China, Oct. 26, 2024.
  5. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 4th International Conference on Electron Devices and Applications, Singapore, Oct. 22, 2024.
  6. "Power-Aware LSI Testing: Present and Future", The 2nd International Symposium of EDA, Xi`an, China, May 12, 2024.
  7. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 7th International Conference on Electronics, Communications and Engineering, Kuala Lumpur, Malaysia, Mar. 23, 2024. Hybrid Event
  8. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 13th International Conference on Information and Electronics Engineering, Jeju, Korea, Feb. 28, 2024. Hybrid Event
  9. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 6th International Conference on Electronics Technology, Chengdu, China, May 13, 2023. Hybrid Event
  10. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 6th International Conference on Electronics, Communications and Control, Fukuoka, Japan, Mar. 25, 2023. Hybrid Event
  11. "Power-Aware Testing for Low-Power VLSI Circuits", The 14th IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip, Singapore, Dec. 21, 2021. Hybrid Event
  12. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 8th IEEE & 9th International Conference on Science, Education, and Viable Engineering, Taitung, Taiwan, Oct. 29, 2021. Virtual Event
  13. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 2021 IEEE International Conference on Electron Devices and Applications, Nanjing, China, Aug. 15, 2021. Virtual Event
  14. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 2nd IEEE International Conference on Control, Measurement and Instrumentation, Calcutta, India, Jan. 9, 2021. Virtual Event
  15. "LSI Testing: A Core Technology to a Successful Semiconductor Industry",The 8th IEEE International Symposium on Next-Generation Electronics, Zhengzhou, China, Oct. 9, 2019.
  16. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", International Conference on Advanced Mechnical and Electronical Engineering, Beijing, China, Dec. 27, 2018.
  17. "Power-Aware VLSI Testing -Challenges and Strategies-", The Workshop of Artificial Intelligence and Its Applications on Next Generation of Internet of Things, Kitakyushu, Japan, Aug. 20, 2018.
  18. "Power-Aware Testing for Low-Power VLSI Circuits", The 2nd International Conference on Circuits, Devices and Systems, Nanjing, China, Aug. 5, 2018.
  19. "Power-Aware Testing for Low-Power VLSI Circuits", The 5th Int'l Symp. on Applied Engineering and Sciences, Serdang, Malaysia, Nov. 14, 2017.
  20. "Power-Aware LSI Testing: Challenges and Strategies", China Test Conference, Nantong, China, Jul. 23, 2016.
  21. "Power-Aware Testing: The Next Stage", Taiwan Tech and Kyutech Advanced VLSI Testing Workshop, Taipei, Taiwan, Sep. 24, 2013.
  22. "Power-Aware Testing: The Next Stage", IEEE European Test Symposium, Annecy, France, May 29, 2012.
  23. "Power-Aware Test for Low-Power Devices", IEEE Workshop on RTL and High Level Testing, Shanghai, China, Dec. 5, 2010.
  24. "Reliability: The Unchanging Value of the Ever-Changing Semiconductor World", IEEE Pacific Rim International Symposium on Dependable Computing, Shanghai, China, Nov. 16, 2009.
  25. "Challenges and Chances in Deep-Submicron LSI Testing", China Test Conference, Suzhou, China, May 21, 2008.