News

Profile

Members

Grants

Papers

Patents

Books

Talks

Services

Awards

Courses

Contact

Keynote Speeches
  1. "Risks of LSIs and What Can We Do about It", The 15th IEEE and the 16th International Conference on Science, Education, Viable Engineering, Kurashiki, Japan, Apr. 14, 2025.
  2. "Power-Aware LSI Testing: Presrnt and Future", The 8th International Conference on Electronics, Communications and Control Engineering, Fukuoka, Japan, Mar. 29, 2025.
  3. "Power-Aware LSI Testing: Presrnt and Future", The Forum on Life-Ccyle-Reliability of Chiplet-Based Systems, Oita, Japan, Mar. 14, 2025.
  4. "Risks of LSIs and How Can We Do about Them", The 7th International Conference on Recent Trends in Image Processing & Pattern Recognition Integrated Circuits and Microsystems, Bhopal, India, Dec. 19, 2024.
  5. "Power-Aware LSI Testing: Present and Future", The 9th International Conference on Integrated Circuits and Microsystems, Wuhan, China, Oct. 26, 2024.
  6. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 4th International Conference on Electron Devices and Applications, Singapore, Oct. 22, 2024.
  7. "Power-Aware LSI Testing: Present and Future", The 2nd International Symposium of EDA, Xi`an, China, May 12, 2024.
  8. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 7th International Conference on Electronics, Communications and Engineering, Kuala Lumpur, Malaysia, Mar. 23, 2024. Hybrid Event
  9. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 13th International Conference on Information and Electronics Engineering, Jeju, Korea, Feb. 28, 2024. Hybrid Event
  10. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 3th International Conference on Electron Devices and Applications, Tokyo, Japan, Oct. 17, 2023.
  11. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 6th International Conference on Electronics Technology, Chengdu, China, May 13, 2023. Hybrid Event
  12. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 6th International Conference on Electronics, Communications and Control, Fukuoka, Japan, Mar. 25, 2023. Hybrid Event
  13. "Power-Aware Testing for Low-Power VLSI Circuits", The 14th IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip, Singapore, Dec. 21, 2021. Hybrid Event
  14. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 8th IEEE & 9th International Conference on Science, Education, and Viable Engineering, Taitung, Taiwan, Oct. 29, 2021. Virtual Event
  15. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 2021 IEEE International Conference on Electron Devices and Applications, Nanjing, China, Aug. 15, 2021. Virtual Event
  16. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", The 2nd IEEE International Conference on Control, Measurement and Instrumentation, Calcutta, India, Jan. 9, 2021. Virtual Event
  17. "LSI Testing: A Core Technology to a Successful Semiconductor Industry",The 8th IEEE International Symposium on Next-Generation Electronics, Zhengzhou, China, Oct. 9, 2019.
  18. "LSI Testing: A Core Technology to a Successful Semiconductor Industry", International Conference on Advanced Mechnical and Electronical Engineering, Beijing, China, Dec. 27, 2018.
  19. "Power-Aware VLSI Testing -Challenges and Strategies-", The Workshop of Artificial Intelligence and Its Applications on Next Generation of Internet of Things, Kitakyushu, Japan, Aug. 20, 2018.
  20. "Power-Aware Testing for Low-Power VLSI Circuits", The 2nd International Conference on Circuits, Devices and Systems, Nanjing, China, Aug. 5, 2018.
  21. "Power-Aware Testing for Low-Power VLSI Circuits", The 5th Int'l Symp. on Applied Engineering and Sciences, Serdang, Malaysia, Nov. 14, 2017.
  22. "Power-Aware LSI Testing: Challenges and Strategies", China Test Conference, Nantong, China, Jul. 23, 2016.
  23. "Power-Aware Testing: The Next Stage", Taiwan Tech and Kyutech Advanced VLSI Testing Workshop, Taipei, Taiwan, Sep. 24, 2013.
  24. "Power-Aware Testing: The Next Stage", IEEE European Test Symposium, Annecy, France, May 29, 2012.
  25. "Power-Aware Test for Low-Power Devices", IEEE Workshop on RTL and High Level Testing, Shanghai, China, Dec. 5, 2010.
  26. "Reliability: The Unchanging Value of the Ever-Changing Semiconductor World", IEEE Pacific Rim International Symposium on Dependable Computing, Shanghai, China, Nov. 16, 2009.
  27. "Challenges and Chances in Deep-Submicron LSI Testing", China Test Conference, Suzhou, China, May 21, 2008.