News

Profile

Members

Research

Grants

Papers

Patents

Books

Talks

Services

Awards

Courses

Contact

1. "IC Testing", The 1st CCF Chip Conference, Nanjing, China, Jul. 30, 2022.

   ---

2. "Education and Training for LSI Testing", The 18th China Fault Tolerant Computing Conference, Beijing, China, Aug. 15, 2019.

   ---

3. "How Much Toggle Activity Shpuld We Be Testing With", IEEE VLSI Test Symposium, Dana Point, USA, May 2, 2011.

   ---

4. "Low-Power Test and Noise-Aware Test: Foes or Friends", IEEE VLSI Test Symposium, Santa Cruz, USA, Apr.19, 2010.

   ---

5. "Searching for High and Low for the Right Test", 4th IEEE International Workshop on Impact of Low-Power design on Test and Reliability, Prague, Czech, May 27, 2010.

   ---

6. "Is Low Power Testing Necessary? What does the Test Industry Truly Need? -> Real Issues and Available Solutions", IEEE Asian Test Symposium, Taichung, Taiwan, Nov. 25, 2009.

   ---

7. "Test Power: A Devil or An Angel", China Test Conference, Suzhou, China, May 23, 2008.