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Tutorials
  1. "Power-Aware Testing in the Era of IoT", P. Girard and X. Wen, IEEE International Conference on Computer Design (Embedded Tutorial), Virtual Conference, Oct. 24, 2021.
  2. "Power-Aware Testing in the Era of IoT", P. Girard and X. Wen, IEEE International Test Conference (Half-Day Tutorial), Washington D.C., USA, Oct. 10, 2021.
  3. "Power-Aware Testing in the Era of IoT", P. Girard and X. Wen, IEEE International Test Conference - India (Half-Day Tutorial), Bengaluru, India, Jul. 12, 2020.
  4. "Power-Aware Testing in the Era of IoT", P. Girard and X. Wen, IEEE International Test Conference (Half-Day Tutorial), Washington D.C., USA, Nov. 10, 2019.
  5. "Power-Aware LSI Testing ~ Challenges and Strategies ~ ", X. Wen, Korea Test Copnference, Seoul, Republic of Korea, Jun. 25, 2019.
  6. "Power-Aware Testing in the Era of IoT", P. Girard and X. Wen, IEEE International Symposium on Circuits & Systems (Mini-Tutorial), Florence, Italy, May 29, 2018.
  7. Power-Aware Testing in the Era of IoT", X. Wen and P. Girard, IEEE Latin-American Test Symposium (Half-Day Tutorial), Sao Paulo, Brazil, Mar. 13, 2018.
  8. Power-Aware Testing in the Era of IoT", X. Wen and P. Girard, IEEE Asian Test Symposium (Half-Day Tutorial), Taipei, Taiwan, Nov. 27, 2017.
  9. "Power-Aware Testing and Test Strategies for Low Power Devices", P. Girard, N. Nicolici, and X. Wen, IEEE Asian Test Symposium (Half-Day Tutorial), Niigata, Japan, Nov. 18, 2012.
  10. "Power-Aware Testing and Test Strategies for Low Power Devices", P. Girard, N. Nicolici, and X. Wen, IEEE International Test Conference (Full-Day Tutorial), Anaheim, USA, Nov. 4, 2012.
  11. "Power-Aware Testing and Test Strategies for Low Power Devices", P. Girard, N. Nicolici, and X. Wen, International Symposium on Quality Electronic Design (Embedded Tutorial), Santa Clara, USA, Mar. 20, 2012.
  12. "Power-Aware Testing and Test Strategies for Low Power Devices", P. Girard, N. Nicolici, and X. Wen, IEEE International Test Conference (Full-Day Tutorial), Anaheim, USA, Sep. 18, 2011.
  13. "Power-Aware Testing and Test Strategies for Low Power Devices", P. Girard, N. Nicolici, and X. Wen, Design, Automation, and Test in Europe (Half-Day Tutorial), Grenoble, France, Mar. 14, 2011.
  14. "Power-Aware Testing and Test Strategies for Low-Power Devices", P. Girard, N. Nicolici, and X. Wen, IEEE International Midwest Symposium on Circuits and Systems (Full-Day Tutorial), Seattle, USA, Aug. 1, 2010.
  15. "Power-Aware Testing and Test Strategies for Low-Power Devices", P. Girard, N. Nicolici, and X. Wen, IEEE International NEWCAS Conference (Half-Day Tutorial), Montreal, Canada, Jun. 20, 2010.
  16. "Power-Aware Testing and Test Strategies for Low-Power Devices", P. Girard, N. Nicolici, and X. Wen, IEEE Asian Test Symposium (Half-Day Tutorial), Taichung, Taiwan, Nov. 23, 2009.
  17. "Power-Aware Testing and Test Strategies for Low-Power Devices", P. Girard, N. Nicolici, and X. Wen, IEEE International Test Conference (Half-Day Tutorial), Austin, USA, Nov. 2, 2009.
  18. "Power-Aware Testing and Test Strategies for Low Power Devices", P. Girard, N. Nicolici, and X. Wen, Design, Automation, and Test in Europe (Half-Day Tutorial), Munich, Germany, Mar. 10, 2008.
  19. "Power Issues in Test", N. Nicolici and X. Wen, IEEE European Test Symposium (Embedded Tutorial), Freiburg, Germany, May 21 2007.
  20. "歩留まり向上に貢献するためのテスト技術の最新動向とその実際・例", 温暁青, 細川利典, 畠山一実, リアライズ理工センターセミナー, 東京, 平成19年6月29日.
  21. "歩留まり向上に貢献するためのテスト技術の最新動向", 温暁青, リアライズ理工センターセミナー, 東京, 平成18年1月24日.
  22. "歩留まり向上に貢献するためのテスト技術の最新動向", 温暁青, 梶原誠司, リアライズ理工センターセミナー, 東京, 平成17年6月23日.