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2012
- 2012.12.12: Prof. Wen was featured on Yumenavi, a website designed for promoting
college education to high school students. The link to the page is here.
- 2012.11.19: A half-day tutorial titled "" was presented by Prof. P. Girard of LIRMM (France) and Prof. Wen at Asian Test Symposium, a major LSI-test-related event, in Niigata, Japan.
- 2012.11.16: Dr. Robert C. Aitken, R&D Fellwo of ARM, visited the Wen Lab and gave a special talk titled "Trends in Low
Power Embedded Processors or How Smart Phones Can Keep Getting Smarter".
The abstract of Dr. Aitken's talk is here.
- 2012.11.6: Prof. Wen presented a paper titled "On Pinpoint Capture Power Management in At-Speed Scan Test Generation" at International Test Conference, the largest LSI-test-related event, in Anaheim, CA, USA. This paper pioneers
the concept of right-power testing, which is a paradigm shift in test power
management, featuring a novel scheme that reduces or increases capture
power in a pinpoint manner for (1) guaranteed capture power safety, (2)
improved small-delay test capability, and (3) minimal test cost impact
in at-speed scan test generation.
- 2012.5.29: Prof. Wen gave an invited talk at European Test Symposium 2012 held in Annecy, France. The presentation PDF file is available upon request
made to wen@cse.kyutech.ac.jp.
- 2012.5.21: Japan-Taiwan Joint Workshop on Advanced VLSI Testing was held in Fukuoka
as part of a JST-sponsored research project headed by Prof. Wen and Prof. J.-L. Huang of National Taiwan University. The program of the workshop is here.
- 2012.4.7: Prof. Wen introduced his research projects and participated in a meeting with the Governor of Fukuoka Prefecture about promoting local LSI-related
research and development activities.
- 2012.3.6: Prof. T.-Y. Ho of National Cheng Kung University (Taiwan) visited the Wen Lab and gave
a special talk. The abstract of Prof. Ho's talk is here.
- 2012.2.17: Prof. I. Polian of University of Passau (Germany) visited the Wen Lab and gave a special
talk. The abstract of Prof. Polian's talk is here.
- 2012.1.27: Prof. K. Chakrabarty of Duke University (USA) visited the Wen Lab and gave a special talk.
The abstract of Prof. Chakrabarty's talk is here.
- 2012.1.8: A news report about low-power test generation patents filed by Prof.
Wen appeared as the top news in today' Nishi-Nippon News. The news report
is available here.
- 2012.1.1: IEEE Board of Directors, at its November 2011 meeting, elevated Prof.
Wen to IEEE Fellow, effective 1 January 2012, with the citation: for contributions to testing of integrated circuits. The list of 2012 newly elevated IEEE fellows is here.
- 2012.1.1: Happy New Year! May 2012 bring you and your family abundant peace, health,
and happiness.
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